Document Center List of Standards on Piezoelectric Devices
ICS Code 31.140
Return to ICS Index.Up to Level 1:
The following documents are a part of this series:
BSI:
- BS-4727-1-GROUP-08 - Piezoelectric Devices for Frequency Control and Selection, Glossary of Electrotechnical,
- BS-5069-1 - Dimensions of piezoelectric devices
- BS-9611 - Rules for the preparation of detail specifications for solder-sealed quartz crystal units of assessed quality for oscillator applications. General application category
- BS-9612 - Rules for the preparation of detail specifications for welded seal quartz crystal units of assessed quality for oscillator applications. General application category
- BS-9612-N004 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N005 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
- BS-9612-N006 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N008 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N009 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
- BS-9612-N010 - Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N016 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N017 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
- BS-9612-N018 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N019 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
- BS-9612-N020 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
- BS-9612-N021 - Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
- BS-9613 - Rules for the preparation of detail specifications for glass-encapsulated quartz crystal units of assessed quality for oscillator applications. General application category
- BS-9617 - Rules for the preparation of detail specifications for quartz crystal units of assessed quality. Full assessment level
- BS-9620 - Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
- BS-9625 - Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level
- BS-EN-168101 - Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
- BS-EN-170000 - Harmonized system of quality assessment for electronic components. Generic specification: waveguide type dielectric resonators
- BS-EN-170100 - Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators
- BS-EN-170101 - Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval
- BS-EN-171000 - Harmonized system of quality assessment for electronic components. Generic specification. Filters using waveguide type dielectric resonators
- BS-EN-50324-1 - Piezoelectric properties of ceramic materials and components
- BS-EN-50324-2 - Piezoelectric properties of ceramic materials and components
- BS-EN-50324-3 - Piezoelectric properties of ceramic materials and components. Methods of measurement. High power
- BS-EN-60122-1 - Quartz crystal units of assessed quality
- BS-EN-60122-3 - Quartz crystal units of assessed quality
- BS-EN-60368-1 - Piezoelectric filters
- BS-EN-60368-2-2 - Piezoelectric filters. Guide to the use of piezoelectric filters
- BS-EN-60368-3 - Piezoelectric filters of assessed quality
- BS-EN-60368-4 - Piezoelectric filters
- BS-EN-60368-4-1 - Piezoelectric filters. Blank detail specification.
- BS-EN-60444-1 - Measurement of quartz crystal unit parameters
- BS-EN-60444-11 - Measurement of quartz crystal unit parameters
- BS-EN-60444-2 - Measurement of quartz crystal unit parameters
- BS-EN-60444-3 - Measurement of quartz crystal unit parameters
- BS-EN-60444-4 - Measurement of quartz crystal unit parameters
- BS-EN-60444-5 - Measurement of quartz crystal unit parameters
- BS-EN-60444-6 - Measurement of quartz crystal unit parameters
- BS-EN-60444-8 - Measurement of quartz crystal unit parameters
- BS-EN-60444-9 - Measurement of quartz crystal unit parameters
- BS-EN-60679-1 - Piezoelectric, dielectric and electrostatic oscillators of assessed quality
- BS-EN-60679-3 - Quartz crystal controlled oscillators of assessed quality
- BS-EN-60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
- BS-EN-60758 - Synthetic quartz crystal. Specifications and guidelines for use
- BS-EN-60758-TC - Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
- BS-EN-60793-1-33 - Optical fibres
- BS-EN-60793-1-33-TC - Tracked Changes. Optical fibres
- BS-EN-60862-1 - Surface acoustic wave (SAW) filters of assessed quality
- BS-EN-61019-1 - Surface acoustic wave (SAW) resonators
- BS-EN-61019-2 - Surface acoustic wave (SAW) resonators
- BS-EN-61240 - Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
- BS-EN-61337-1 - Filters using waveguide type dielectric resonators
- BS-EN-61337-1-1 - Filters using waveguide type dielectric resonators. General information, standard values and test conditions
- BS-EN-61338-1 - Waveguide type dielectric resonators
- BS-EN-61338-1-3 - Waveguide type dielectric resonators.
- BS-EN-61338-1-4 - Waveguide type dielectric resonators
- BS-EN-61338-1-5 - Waveguide type dielectric resonators
- BS-EN-61338-2 - Waveguide type dielectric resonators
- BS-EN-61338-4 - Waveguide type dielectric resonators
- BS-EN-61338-4-1 - Waveguide type dielectric resonators
- BS-EN-61837-1 - Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections
- BS-EN-61837-2 - Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections
- BS-EN-61837-3 - Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections
- BS-EN-61837-4 - Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections
- BS-EN-62276 - Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
- BS-EN-62575-1 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality
- BS-EN-62575-2 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality
- BS-EN-62604-1 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality
- BS-EN-62604-2 - Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality. Guidelines for the use
- BS-EN-62761 - Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
- BS-EN-62884-1 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators
- BS-EN-62884-2 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators
- BS-EN-IEC-60122-4 - Quartz crystal units of assessed quality
- BS-EN-IEC-60444-6 - Measurement of quartz crystal unit parameters
- BS-EN-IEC-60444-6-TC - Tracked Changes. Measurement of quartz crystal unit parameters
- BS-EN-IEC-61837-2 - Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections
- BS-EN-IEC-62604-1 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality
- BS-EN-IEC-62604-1-TC - Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality
- BS-EN-IEC-62604-2 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality
- BS-EN-IEC-62884-3 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators
- BS-EN-IEC-62884-4 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators
- BS-EN-IEC-63041-1 - Piezoelectric sensors
- BS-EN-IEC-63041-2 - Piezoelectric sensors
- BS-EN-IEC-63041-3 - Piezoelectric sensors
- BS-EN-IEC-63155 - Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
- BS-IEC-62047-30 - Semiconductor devices. Micro-electromechanical devices
- BS-IEC-62047-33 - Semiconductor devices. Micro-electromechanical devices
- BS-IEC-62047-34 - Semiconductor devices. Micro-electromechanical devices
- BS-IEC-62047-36 - Semiconductor devices. Micro-electromechanical devices
- DD-IEC-61994-1 - Piezoelectric and dielectric devices for frequency control and selection. Glossary
- DD-IEC-61994-2 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- DD-IEC-61994-3 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- DD-IEC-61994-4-1 - Piezoelectric and dielectric devices for frequency control and selection. Glossary
- DD-IEC-61994-4-2 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- DD-IEC-61994-4-3 - Piezoelectric and dielectric devices for frequency control and selection. Glossary
- DD-IEC-61994-4-4 - Piezoelectric and dielectric devices for frequency control and selection. Glossary
- DD-IEC/PAS-60679-6 - Quartz crystal controlled oscillators of assessed quality
- DD-IEC/PAS-61338-1-5 - Waveguide type dielectric resonators
- PD-IEC-61994-3 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC-61994-4-1 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC-61994-4-1-TC - Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC-61994-4-4 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC-61994-4-4-TC - Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC-61994-5 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary
- PD-IEC/PAS-62276 - Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
- PD-IEC/PAS-62277 - Test-Fixture of Surface Mounting Quartz Crystal Units
IEC:
- IEC-1019-3 - Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
- IEC-1080 - Guide to the measurement of equivalent electrical parameters of quartz crystal units
- IEC-1178-2 - Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
- IEC-1178-2-1 - Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
- IEC-1178-3 - Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
- IEC-1178-3-1 - Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
- IEC-122-2 - Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection
- IEC-122-2-1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
- IEC-122-2-1-1 - Amendment No. 1
- IEC-1253-1 - Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
- IEC-1253-2 - Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
- IEC-1253-2-1 - Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
- IEC-1261-1 - Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
- IEC-1261-2 - Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
- IEC-1261-2-1 - Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
- IEC-368-2-1 - Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters
- IEC-368-2-2 - Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
- IEC-444-1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
- IEC-444-2 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
- IEC-444-4 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of qu (TITLE TRUNCATED)
- IEC-444-5 - Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
- IEC-483 - Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
- IEC-60050-561 - International electrotecnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC-60050-561-AM1 - Amendment 1 - International electrotechnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC-60050-561-AM3 - Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC-60050-561-AM4 - Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC-60122-1 - Quartz crystal units of assessed quality - Part 1: Generic specification
- IEC-60122-1-AM1 - Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
- IEC-60122-3 - Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
- IEC-60122-4 - Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
- IEC-60368-1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
- IEC-60368-1-1 - Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
- IEC-60368-3 - Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
- IEC-60368-4 - Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
- IEC-60368-4-1 - Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
- IEC-60444-11 - Measrurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC-60444-1-1 - Amendment 1
- IEC-60444-6 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC-60444-6-RL - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC-60444-7 - Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
- IEC-60444-8 - Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
- IEC-60444-9 - Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
- IEC-60679-1 - Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification
- IEC-60679-1-2 - Amendment 2: Quartz Crystal Controlled Oscillators of Assessed Quality - Part 1: Generic S
- IEC-60679-3 - Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
- IEC-60679-4 - Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
- IEC-60679-4-1 - Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
- IEC-60679-5 - Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
- IEC-60679-5-1 - Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
- IEC-60679-6 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
- IEC-60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
- IEC-60758 - Synthetic quartz crystal - Specifications and guidelines for use
- IEC-60862-1 - Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
- IEC-60862-2 - Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
- IEC-60862-3 - Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
- IEC-61019-1 - Surface acoustic wave (SAW) resonators - Part 1: Generic specification
- IEC-61019-2 - Part 2: Guide To the Use, Surface Acoustic Wave (Saw Resonators
- IEC-61240 - Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
- IEC-61337-1 - Filters using waveguide type dielectric resonators - Part 1: Generic specification
- IEC-61337-1-2 - Part 1-2: Test Conditions, Filters Using Waveguide Type Dielectric Resonators -
- IEC-61337-2 - Part 2: Guidance for Use, Filters Using Waveguide Type Dielectric Resonators
- IEC-61338-1 - Waveguide type dielectric resonators - Part 1: Generic specification
- IEC-61338-1-4 - Part 1-4: General Information & Test Conditions - Measurement Method of Complex Relati
- IEC-61338-1-5 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
- IEC-61338-2 - Part 2: Guidelines for Oscillator & Filter Applications, Waveguide Type Dielectric Resonat
- IEC-61338-4-1 - Waveguide type dielectric resonators - Part 4-1: Blank detail specification
- IEC-61837-1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
- IEC-61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC-61837-2-AM1 - Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC-61837-3 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
- IEC-61837-4 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
- IEC-61994-1 - Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
- IEC-61994-2 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
- IEC-61994-3 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators
- IEC-61994-4-1 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
- IEC-61994-4-1-RL - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
- IEC-61994-4-2 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
- IEC-61994-4-3 - Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
- IEC-61994-4-4 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
- IEC-61994-4-4-RL - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
- IEC-61994-5 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
- IEC-61994-5-RL - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
- IEC-62047-30 - Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
- IEC-62047-33 - Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
- IEC-62047-36 - Semiconductor devices . Micro-electromechanical devices . Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
- IEC-62047-37 - Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
- IEC-62276 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- IEC-62575-1 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
- IEC-62575-2 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
- IEC-62604-1 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
- IEC-62604-1-RL - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
- IEC-62604-2 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- IEC-62604-2-RL - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- IEC-62761 - Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
- IEC-62884-1 - Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 1: Basic methods for the measurement
- IEC-62884-2 - Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
- IEC-62884-3 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- IEC-62884-4 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
- IEC-63041-1 - Piezoelectric sensors - Part 1: Generic specifications
- IEC-63041-1-RL - Piezoelectric sensors - Part 1: Generic specifications
- IEC-63041-2 - Piezoelectric sensors - Part 2: Chemical and biochemical sensors
- IEC-63041-3 - Piezoelectric sensors - Part 3: Physical sensors
- IEC-63155 - Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
- IEC-642 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
- IEC-642-1 - Amendment No. 1
- IEC-642-2 - Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units
- IEC-642-3 - Piezoelectric ceramic resonators - Part 3: Standard outlines
- IEC-679-2 - Quartz crystal controlled oscillators. Part 2: Guide to the use of quartz crystal controlled oscillators
- IEC/PAS-60679-6 - Part 6: Phase Jitter Measurement Method for Quartz Crystal Oscillators & Saw Oscillato
- IEC/PAS-61338-1-5 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
- IEC/PAS-61338-2 - Part 2: Guide To the Use of Waveguide Type Dielectric Resonators, Waveguide Type Dielectri
- IEC/PAS-62276 - Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification & Measuring
Other SDOs:
- EN-168101 - Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif
- EN-60122-1 - Quartz crystal units of assessed quality - Part 1: Generic specification
- EN-60122-1/A1 - Quartz crystal units of assessed quality - Part 1: Generic specification
- EN-60122-3 - Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
- EN-60368-3 - Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
- EN-60444-1 - Part 1: Basic Method for the Measurement of Resonance Frequency & Resonance Resistance
- EN-60444-11 - Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- EN-60444-2 - Measurement of Quartz Crystal Unit Parameters, Phase Offset Method for Measurement Of
- EN-60444-3 - Measurement of Quartz Crystal Unit Parameters, Basic Method for the Measurement of Tw
- EN-60444-4 - Measurement of Quartz Crystal Unit Parameters, Method for the Measurement of the Load
- EN-60444-5 - Measurement of Quartz Crystal Unit Parameters, Methods for the Determination of Equiva
- EN-60444-6 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- EN-60444-8 - Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
- EN-60444-9 - Measurement of Quartz Crystal Unit Parameters, Measurement of Spurious Resonances of P
- EN-60679-1 - Quartz Crystal Controlled Oscillators of Assessed Quality, Generic Specification
- EN-60679-3 - Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
- EN-60679-6 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
- EN-60689 - Measurement & Test Methods for Tuning Fork Quartz Crystal Units in the Range From 10 K
- EN-60758 - Synthetic quartz crystal - Specifications and guidelines for use
- EN-60862-1 - Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
- EN-60862-2 - Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
- EN-61019-2 - Surface Acoustic Wave (Saw) Resonators, Guide To the Use
- EN-61240 - Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
- EN-61338-1-5 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
- EN-61837-1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
- EN-61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- EN-61837-3 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
- EN-61837-4 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
- EN-62276 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- EN-62575-1 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
- EN-62575-2 - Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
- EN-62604-1 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
- EN-62761 - Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
- EN-62884-1 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
- EN-IEC-60122-4 - Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019)
- EN-IEC-61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- EN-IEC-62604-2 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- EN-IEC-62884-3 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- EN-IEC-62884-4 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 62884-4:2019)
- EN-IEC-63041-1 - Piezoelectric sensors. Generic specifications
- EN-IEC-63041-2 - Piezoelectric sensors - Part 2: chemical and biochemical Sensors
- JIS-C-6704 - Synthetic Quartz Crystal
- JIS-C-6710 - Generic specification of crystal controlled oscillators