IEC-62047-30 › Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

IEC-62047-30 - EDITION 1.0 - CURRENT


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IEC 62047-30:2017(E) specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film used for micro sensors and micro actuators, and its reporting schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric devices. This document applies to piezoelectric thin films fabricated by MEMS process
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31.080.99 (Other semiconductor devices)

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Document Number

IEC 62047-30 Ed. 1.0 en:2017

Revision Level

EDITION 1.0

Status

Current

Publication Date

Sept. 1, 2017

Committee Number

47F