IEC-444-2 › Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC-444-2
-
1ST EDITION
-
CURRENT
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Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
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31.140 (Piezoelectric devices)
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Document Number
IEC 60444-2 Ed. 1.0 b:1980
Revision Level
1ST EDITION
Status
Current
Publication Date
Jan. 1, 1980
Committee Number
49