BS-IEC-63284 › Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS-IEC-63284 - 2022 EDITION - CURRENT


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Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Keywords

Testing methods;Metal oxide semiconductors;Semiconductors;Electronic equipment and components;Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

31.080.30 (Transistors)

31.080.99 (Other semiconductor devices)

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Document Number

BS IEC 63284:2022

Revision Level

2022 EDITION

Status

Current

Publication Date

Nov. 11, 2022

Page Count

16

ISBN

9780539126433

International Equivalent

IEC 63284 Ed.1.0;EN 63284 Ed.1.0

Committee Number

EPL/47