BS-IEC-63229 › Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

BS-IEC-63229 - 2023 EDITION - CURRENT


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Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Keywords

Substrates (insulating);Semiconductor technology;Electrical equipment;Common terms;Components;Computer components;Computer hardware;Electronic equipment and components;Electrical components

To find similar documents by classification:

31.080 (Semiconductor devices Semiconducting materials, see 29.045)

31.080.01 (Semiconductor devices in general)

31.080.99 (Other semiconductor devices)

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Document Number

BS IEC 63229:2021

Revision Level

2023 EDITION

Status

Current

Publication Date

Aug. 31, 2023

Page Count

24

ISBN

9780539029208

International Equivalent

IEC 63229 Ed.1.0

Committee Number

EPL/47