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Scope

Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Notes

Claudia's Notes:
Sometimes people are unsure what edition of a Test Method to use because they are referenced individually by the basic number itself, rather than using the complete current number (including revision data.)  This practice has risen to avoid the necessity for changing specifications that refer to this test methods of a given standard.  Your best bet is to always use the complete current edition of any Test Method standard to make sure you've got the most current edition of all the test methods included.

To find similar documents by Federal Supply Class Code:

FSC 5961 (Semiconductor Devices and Associated Hardware)

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