ISO-21068-4 › Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon - Part 4: XRD methods

ISO-21068-4 - 1ST EDITION - CURRENT


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This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.

It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of -Si3N4, -Si3N4, Si2ON2, AlN, and .- SiAlON are described.

For quantitative determination of -Si3N4, -Si3N4, Si2ON2, AlN and .-SiAlON refinement procedures based on the total nitrogen content of the sample are described.

NOTE            ISO 21068-3 is used for the analysis of the total nitrogen content of the sample.

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Document Number

ISO 21068-4:2024

Revision Level

1ST EDITION

Status

Current

Publication Date

June 1, 2024

Committee Number

ISO/TC 33