IEC-62969-4 › Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
IEC-62969-4
-
EDITION 1.0
-
CURRENT
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IECĀ 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
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31.080.99 (Other semiconductor devices)
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Document Number
IEC 62969-4 Ed. 1.0 b:2018
Revision Level
EDITION 1.0
Status
Current
Publication Date
June 1, 2018
Committee Number
47