IEC-62899-503-3 › Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

IEC-62899-503-3 - EDITION 1.0 - CURRENT


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IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.
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29.045 (Semiconducting materials)

31.080.30 (Transistors)

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Document Number

IEC 62899-503-3 Ed. 1.0 en:2021

Revision Level

EDITION 1.0

Status

Current

Publication Date

Aug. 1, 2021

Committee Number

119