IEC-62899-503-1 › Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
IEC-62899-503-1
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EDITION 1.0
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CURRENT
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IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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29.045 (Semiconducting materials)
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Document Number
IEC 62899-503-1 Ed. 1.0 en:2020
Revision Level
EDITION 1.0
Status
Current
Publication Date
May 1, 2020
Committee Number
119