IEC-62435-2 › Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

IEC-62435-2 - EDITION 1.0 - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

ORDER

Price:

$143.56        


Want this as a site license?

To find similar documents by classification:

31.020 (Electronic components in general Magnetic components, see 29.100.10)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC 62435-2 Ed. 1.0 b:2017

Revision Level

EDITION 1.0

Status

Current

Publication Date

Jan. 1, 2017

Committee Number

47