IEC-62417 › Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
IEC-62417
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EDITION 1.0
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CURRENT
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IEC 62417:2010 provides a wafer level test procedure to determine the amount of positive mobile charge in oxide layers in metal-oxide semiconductor field effect transistors. It is applicable to both active and parasitic field effect transistors. The mobile charge can cause degradation of microelectronic devices, e.g. by shifting the threshold voltage of MOSFETs or by inversion of the base in bipolar transistors.
To find similar documents by classification:
31.080 (Semiconductor devices Semiconducting materials, see 29.045)
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Document Number
IEC 62417 Ed. 1.0 b:2010
Revision Level
EDITION 1.0
Status
Current
Publication Date
April 1, 2010
Committee Number
47