IEC-62415 › Semiconductor devices - Constant current electromigration test

IEC-62415 - EDITION 1.0 - CURRENT


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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
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31.080 (Semiconductor devices Semiconducting materials, see 29.045)

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Document Number

IEC 62415 Ed. 1.0 b:2010

Revision Level

EDITION 1.0

Status

Current

Publication Date

May 1, 2010

Committee Number

47