IEC-62373 › Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

IEC-62373 - 1ST EDITION - CURRENT


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Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
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31.080 (Semiconductor devices Semiconducting materials, see 29.045)

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Document Number

IEC 62373 Ed. 1.0 b:2006

Revision Level

1ST EDITION

Status

Current

Publication Date

July 1, 2006

Committee Number

47