IEC-62047-40 › Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

IEC-62047-40 - EDITION 1.0 - CURRENT


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IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.
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Document Number

IEC 62047-40 Ed. 1.0 en:2021

Revision Level

EDITION 1.0

Status

Current

Publication Date

Sept. 1, 2021

Committee Number

47F