IEC-62047-32 › Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
IEC-62047-32
-
EDITION 1.0
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CURRENT
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IECĀ 62047-32:2019 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators.
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31.080.99 (Other semiconductor devices)
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Document Number
IEC 62047-32 Ed. 1.0 b:2019
Revision Level
EDITION 1.0
Status
Current
Publication Date
Jan. 1, 2019
Committee Number
47F