IEC-60749-24 › Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

IEC-60749-24 - 1ST EDITION - CURRENT


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The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
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31.080 (Semiconductor devices Semiconducting materials, see 29.045)

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Document Number

IEC 60749-24 Ed. 1.0 b:2004

Revision Level

1ST EDITION

Status

Current

Publication Date

March 1, 2004

Committee Number

47