EN-60749-40 › Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

EN-60749-40 - 2011 EDITION - CURRENT -- See the following: BS-EN-60749-40 DIN-EN-60749-40



Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge


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Document Number

EN 60749-40:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Sept. 2, 2011