BS-EN-60749-40 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-40
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2011 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Integrated circuits;Drop tests;Mechanical testing;Semiconductor devices;Electronic equipment and components;Impact testing;Strain measurement;Surface mounting devices;Accelerated testing;Environmental testing;Printed-circuit boards
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-40:2011
Revision Level
2011 EDITION
Status
Current
Publication Date
Sept. 30, 2011
Page Count
26
ISBN
9780580646294
International Equivalent
EN 60384-3:2006;IEC 60749-40:2011;EN 60749-40:2011
Committee Number
EPL/47