EN-60749-30 › Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

EN-60749-30 - 2005 EDITION - CURRENT -- See the following: BS-EN-60749-30



Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing


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Document Number

EN 60749-30:2005

Revision Level

2005 EDITION

Status

Current

Publication Date

March 1, 2005