BS-EN-60749-30 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Semiconductor devices;Electronic equipment and components;Mechanical testing;Performance testing;Specimen preparation;Environmental testing;Reliability;Climate;Surface mounting devices;Integrated circuits
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-30:2005:2011
Revision Level
2005/A1 EDITION
Status
Superseded
Publication Date
Sept. 30, 2011
Replaced By
BS EN IEC 60749-30:2020
Page Count
16
ISBN
9780580687495
International Equivalent
EN 60749-30:2005/A1:2011;IEC 60749-30:2005;IEC 60749-30:2005/AMD1:2011
Committee Number
EPL/47