BS-IEC-63068-3 › Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
BS-IEC-63068-3
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2020 EDITION
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CURRENT
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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
Keywords
Tests;Testing;Integrated circuit technology;Semiconductor devices;Electronic equipment and components
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
31.080.99 (Other semiconductor devices)
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Document Number
BS IEC 63068-3:2020
Revision Level
2020 EDITION
Status
Current
Publication Date
July 24, 2020
Page Count
28
ISBN
9780539021363
International Equivalent
IEC 63068-3 Ed.1.0
Committee Number
EPL/47