BS-IEC-63068-2 › Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
BS-IEC-63068-2
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2019 EDITION
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CURRENT
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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
Keywords
Inspection;Test methods;Silicon carbide;Defects;Electronic equipment and components;Integrated circuit technology;Semiconductor devices
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS IEC 63068-2:2019
Revision Level
2019 EDITION
Status
Current
Publication Date
Feb. 8, 2019
Page Count
28
ISBN
9780580513749
International Equivalent
IEC 63068-2:2019
Committee Number
EPL/47