BS-IEC-63068-1 › Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
BS-IEC-63068-1
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2019 EDITION
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CURRENT
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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices
Keywords
Electronic equipment and components;Integrated circuit technology;Semiconductor devices;Defects;Silicon carbide
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS IEC 63068-1:2019
Revision Level
2019 EDITION
Status
Current
Publication Date
May 10, 2019
Page Count
26
ISBN
9780580964138
International Equivalent
IEC 63068-1:2019
Committee Number
EPL/47