BS-IEC-62047-29 › Semiconductor devices. Micro-electromechanical devices
BS-IEC-62047-29
-
2017 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Micro-electromechanical devices
Keywords
Analysis;Test methods;Electromechanical devices;Semiconductor devices;Thin films
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
31.080.99 (Other semiconductor devices)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS IEC 62047-29:2017
Revision Level
2017 EDITION
Status
Current
Publication Date
March 15, 2018
Page Count
16
ISBN
9780580940132
International Equivalent
IEC 62047-29:2017
Committee Number
EPL/47