BS-IEC-62047-28 › Semiconductor devices. Micro-electromechanical devices
BS-IEC-62047-28
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2020 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Test equipment;Test specimens;Vibration;Resonance;Bend testing;Fatigue testing;Thin-film devices;Integrating circuits;Semiconductor technology;Electromechanical devices;Electronic equipment and components;Semiconductor devices
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS IEC 62047-28:2017
Revision Level
2020 EDITION
Status
Current
Publication Date
July 22, 2020
Page Count
20
ISBN
9780580901980
International Equivalent
IEC 62047-28:2017
Committee Number
EPL/47