BS-IEC-62047-27 › Semiconductor devices. Micro-electromechanical devices
BS-IEC-62047-27
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2020 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Resonance;Vibration;Semiconductor devices;Thin-film devices;Semiconductor technology;Fatigue testing;Electromechanical devices;Integrated circuits;Test specimens;Electronic equipment and components;Test equipment;Bend testing
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS IEC 62047-27:2017
Revision Level
2020 EDITION
Status
Current
Publication Date
July 22, 2020
Page Count
20
ISBN
9780580899096
International Equivalent
IEC 62047-27:2017
Committee Number
EPL/47