BS-EN-62417 › Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

BS-EN-62417 - 2010 EDITION - CURRENT


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Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Keywords

Transistors;Metals;Semiconductor devices;Thermal testing;Ions;Semiconductors;Field-effect transistors;Migration (chemical);Electrical measurement;Oxides

To find similar documents by classification:

31.080.30 (Transistors)

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Document Number

BS EN 62417:2010

Revision Level

2010 EDITION

Status

Current

Publication Date

June 30, 2010

Page Count

12

ISBN

9780580586224

International Equivalent

EN 62417:2010;EN 61192-1:2003;IEC 62417:2010

Committee Number

EPL/47