BS-EN-62416 › Semiconductor devices. Hot carrier test on MOS transistors

BS-EN-62416 - 2010 EDITION - CURRENT


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Semiconductor devices. Hot carrier test on MOS transistors

Keywords

Semiconductor devices;Metal oxide semiconductors;Endurance testing;Electrical testing;Stress;Semiconductors;Transistors;Life (durability)

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31.080.30 (Transistors)

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Document Number

BS EN 62416:2010

Revision Level

2010 EDITION

Status

Current

Publication Date

July 31, 2010

Page Count

14

ISBN

9780580586217

International Equivalent

EN 62416:2010;IEC 62416:2010

Committee Number

EPL/47