BS-EN-62374 › Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
BS-EN-62374
-
2007 EDITION
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SUPERSEDED
-- See the following:
BS-EN-62374-1
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Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Keywords
Mathematical calculations;Electrical measurement;Semiconductor devices;Testing conditions;Semiconductors;Films (states of matter);Dielectric breakdown;Life (durability)
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 62374:2007
Revision Level
2007 EDITION
Status
Superseded
Publication Date
Oct. 31, 2008
Page Count
24
ISBN
9780580540486
International Equivalent
IEC 62374:2007;EN 62374:2007
Committee Number
EPL/47