BS-EN-62374-1 › Semiconductor devices
BS-EN-62374-1
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2010 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2010 EDITION - Dec. 31, 2010
2010 EDITION CORRIGENDUM 1 - June 1, 2011
2010 EDITION CORRIGENDUM 1 - June 1, 2011
Keywords
Electrical measurement;Semiconductors;Dielectric breakdown;Life (durability);Testing conditions;Semiconductor devices;Films (states of matter)
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 62374-1:2010
Revision Level
2010 EDITION
Status
Current
Publication Date
June 30, 2011
Page Count
20
ISBN
9780580752063
International Equivalent
EN 62374-1:2010/AC:2011;IEC 60809:2014/AMD1:2017
Committee Number
EPL/47