BS-EN-62047-18 › Semiconductor devices. Micro-electromechanical devices
BS-EN-62047-18
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2013 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Semiconductor technology;Bend testing;Test specimens;Test equipment;Resonance;Integrated circuits;Semiconductor devices;Fatigue testing;Thin-film devices;Electromechanical devices;Vibration;Electronic equipment and components
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS EN 62047-18:2013
Revision Level
2013 EDITION
Status
Current
Publication Date
Oct. 31, 2013
Page Count
18
ISBN
9780580720116
International Equivalent
IEC 62047-18:2013;EN 62047-18:2013
Committee Number
EPL/47