BS-EN-62047-12 › Semiconductor devices. Micro-electromechanical devices
BS-EN-62047-12
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2011 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Semiconductor devices;Test equipment;Vibration;Bend testing;Fatigue testing;Integrated circuits;Electromechanical devices;Test specimens;Thin-film devices;Semiconductor technology;Resonance;Electronic equipment and components
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS EN 62047-12:2011
Revision Level
2011 EDITION
Status
Current
Publication Date
Nov. 30, 2011
Page Count
34
ISBN
9780580763014
International Equivalent
IEC 62047-12:2011;EN 62047-12:2011
Committee Number
EPL/47