BS-EN-62047-10 › Semiconductor devices. Micro-electromechanical devices
BS-EN-62047-10
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2011 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Compression testing;Semiconductor technology;Test specimens;Electronic equipment and components;Stress;Integrated circuits;Electromechanical devices;Semiconductor devices;Strain measurement
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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Document Number
BS EN 62047-10:2011
Revision Level
2011 EDITION
Status
Current
Publication Date
Sept. 30, 2011
Page Count
18
ISBN
9780580694479
International Equivalent
IEC 62047-10:2011;EN 62047-10:2011
Committee Number
EPL/47