BS-EN-60749-13 › Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

BS-EN-60749-13 - AMD 14113 - SUPERSEDED -- See the following: BS-EN-IEC-60749-13
Show Complete Document History

Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

Keywords

Corrosion resistance;Electronic equipment and components;Accelerated corrosion tests;Integrated circuits;Destructive testing;Environmental testing;Mechanical testing;Salts;Salt-spray tests;Accelerated testing;Climate;Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

ORDER

Want this as a site license?



Document Number

BS-EN-60749-13

Revision Level

AMD 14113

Status

Superseded

Publication Date

Sept. 17, 2002

International Equivalent

EN 60749-13 (IEC 60749-13:2002) AS;IEC 60749-13:2002

Committee Number

EPL/47