BS-EN-IEC-60749-13 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-13
-
2018 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Mechanical and climatic test methods
Keywords
Destructive testing;Environmental testing;Salt-spray tests;Electronic equipment and components;Mechanical testing;Accelerated corrosion tests;Climate;Integrated circuits;Accelerated testing;Salts;Corrosion resistance;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS EN IEC 60749-13:2018
Revision Level
2018 EDITION
Status
Current
Publication Date
April 30, 2018
Replaces
BS EN 60749-13:2002
Page Count
20
ISBN
9780580984228
International Equivalent
IEC 60749-13:2018;EN IEC 60749-13:2018
Committee Number
EPL/47