ASTM-F632 › Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)

ASTM-F632 - 1990 EDITION - CANCELLED
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Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
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Keywords

ICS Number Code 31.080.30 (Transistors)

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

To find similar documents by classification:

31.080.30 (Transistors)

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Document Number

ASTM-F632-90

Revision Level

1990 EDITION

Status

Cancelled

Modification Type

Withdrawn

Publication Date

Feb. 23, 1990

Document Type

Test Method

Page Count

6 pages