ASTM-F1340 › Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)

ASTM-F1340 - 1992 EDITION - SUPERSEDED
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Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
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Keywords

ICS Number Code 31.080.30 (Transistors)

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

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31.080.30 (Transistors)

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Document Number

ASTM-F1340-92

Revision Level

1992 EDITION

Status

Superseded

Modification Type

Withdrawn

Publication Date

May 15, 1992

Document Type

Test Method

Page Count

5 pages