PD-IEC-63133 › Semiconductor devices. Scan based ageing level estimation for semiconductor devices
PD-IEC-63133
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2017 EDITION
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CURRENT
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Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Keywords
Electronic equipment and components;Storage;Performance;Estimation;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
PD IEC/TR 63133:2017
Revision Level
2017 EDITION
Status
Current
Publication Date
Jan. 29, 2018
Page Count
20
ISBN
9780580988516
International Equivalent
IEC TR 63133:2017
Committee Number
EPL/47