MIL-T-38986 › Test Set, Wafer and Integrated Circuit, Microelectronic TTU-311/E (No Superseding Document)
Test Set, Wafer and Integrated Circuit, Microelectronic TTU-311/E (No Superseding Document)
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Document Number
MIL-T-38986
Revision Level
NOT
Status
Superseded
Publication Date
Oct. 1, 1982