ISO-17470 › Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

ISO-17470 - 2ND EDITION - CURRENT
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ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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Document Number

ISO 17470:2014

Revision Level

2ND EDITION

Status

Current

Publication Date

Jan. 15, 2014

Committee Number

ISO/TC 202/SC 2