IEC/PAS-62483 › Test Method for Measuring Whisker Growth on Tin & Tin Alloy Surface Finishes

IEC/PAS-62483 - 1ST EDITION - CURRENT



Test Method for Measuring Whisker Growth on Tin & Tin Alloy Surface Finishes


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31.080.01 (Semiconductor devices in general)

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Document Number

IEC/PAS 62483 Ed. 1.0 en:2006

Revision Level

1ST EDITION

Status

Current

Publication Date

Sept. 1, 2006

Page Count

34 pages