IEC/PAS-62203 › Guide for the Standard Probe Pad Sizes & Layouts for Wafer-Level Electrical Testing

IEC/PAS-62203 - EDITION 1.0 - SUPERSEDED
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Guide for the Standard Probe Pad Sizes & Layouts for Wafer-Level Electrical Testing


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Document Number

IEC/PAS 62203 Ed. 1.0 en:2000

Revision Level

EDITION 1.0

Status

Superseded

Publication Date

Nov. 1, 2000

Page Count

14 pages