IEC/PAS-62162 › Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
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Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
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Document Number
IEC/PAS 62162 Ed. 1.0 en:2000
Revision Level
2000 EDITION
Status
Superseded
Publication Date
Aug. 1, 2000
Committee Number
47