IEC-68-2-29 › Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump

IEC-68-2-29 - 2ND EDITION CORRIGENDUM 1 - SUPERSEDED -- See the following: IEC-60068-2-27
Show Complete Document History


Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump


 

Customers who bought this document also bought:

IPC-A-610
Acceptability of Electronic Assemblies (Hardcopy format)

MIL-STD-810
Environmental Engineering Considerations and Laboratory Tests

MIL-STD-883
Microcircuits

ORDER

Want this as a site license?



Document Number

IEC-68-2-29

Revision Level

2ND EDITION CORRIGENDUM 1

Status

Superseded

Publication Date

Oct. 1, 1987

Page Count

1 page