IEC-63287-2 › Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

IEC-63287-2 - EDITION 1.0 - CURRENT


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IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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Document Number

IEC 63287-2 Ed. 1.0 b:2023

Revision Level

EDITION 1.0

Status

Current

Publication Date

March 1, 2023

Committee Number

47