IEC-62878-2-4 › Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
IEC-62878-2-4
-
EDITION 1.0
-
CURRENT
Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
To find similar documents by classification:
31.180 (Printed circuits and boards)
31.190 (Electronic component assemblies Including preassembled modules)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
IEC/TS 62878-2-4 Ed. 1.0 b:2015
Revision Level
EDITION 1.0
Status
Current
Publication Date
March 27, 2015
Committee Number
91