IEC-62878-2-2 › Device embedded substrate - Part 2-2: Guidelines - Electrical testing

IEC-62878-2-2 - EDITION 1.0 - CURRENT


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IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
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Document Number

IEC/TR 62878-2-2 Ed. 1.0 b:2015

Revision Level

EDITION 1.0

Status

Current

Publication Date

Dec. 1, 2015

Committee Number

91