IEC-62215-3 › Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

IEC-62215-3 - EDITION 1.0 - CURRENT


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IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

IEC 62215-3 Ed. 1.0 b:2013

Revision Level

EDITION 1.0

Status

Current

Publication Date

July 1, 2013

Committee Number

47A