IEC-61189-5-503 › Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
IEC-61189-5-503
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EDITION 1.0
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CURRENT
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IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
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31.180 (Printed circuits and boards)
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Document Number
IEC 61189-5-503 Ed. 1.0 en:2017
Revision Level
EDITION 1.0
Status
Current
Publication Date
May 1, 2017
Committee Number
91